| 7-1 Insulation Resistance (Unmated) | Between adjacent contacts and contacts and ground. | EIA 364-21C (Apply 100V DC) | 100M minimum |
| 7-2 Low Level Contact Resistance | Initial for VBUS and GND contacts and all other contacts; delta. | EIA 364-23b (100mA max., 20mV max. open circuit) | 40m(Max) initial, 10m(Max) after test |
| 7-3 Dielectric Withstanding Voltage | Between adjacent terminals. | EIA 364-20 (Subject to 100VAC (RMS) for 1 minute) | There shall be no breakdown |
| 7-4 Contact current rating | Applied to VBUS pins, VCONN pin, and other contacts. Temperature rise limit. | EIA364-70 | VBUS: 5.0A, VCONN: 1.25A, Others: 0.25A. Max 30C temperature rise at 25C ambient. |
| Durability | Cycle test criteria after completion. | EIA 364-09 (10000 cycles at 200 cycles/hour) | Contact resistance (40m max delta), Insertion force (5N-20N), Extraction force (8N-20N), Visual inspection (no exposed base metal). |
| Cable Flexing | No discontinuity or physical damage during flexing. | EIA 364-41 (100 cycles in 2 planes at 120 degrees, X=3.7x cable diameter) | No discontinuity over 1 microsecond. |
| Cable Pull-Out | No discontinuity or physical damage. | EIA-364-38 (40N steady state axial load for 1 minute) | No discontinuity or physical damage. |
| 4-axes continuity test | No discontinuity or physical damage. | EIA364-18 (8N tensile force for 10 seconds in 4 directions) | No discontinuity greater than 1s and no physical damage. |
| Temperature Life | Visual inspection, test sequence. | EIA 364-17 (105C for 120 hours, or 72 hours for preconditioning) | Shall meet visual requirements, no physical damage. |
| Thermal Shock | No evidence of physical damage. | EIA 364-32 (10 cycles -55C and +85C, mated connectors) | No physical damage. |
| Salt Spray | Visual requirement, no physical damage. Additional tests as specified. | MIL-STD-202F, Method 101D, Condition B (48 hours at 35C with 5% Salt-solution) | Shall meet visual requirement, show no physical damage. Shall meet requirements of additional tests as specified in test sequence in Section 5. |
