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SHETIME NOS21-S1F1-2000-A

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SHETIME NOS21-S1F1-2000-A

Model Number : NOS21-S1F1-2000-A

Card Connection Mode : Push-Push

Description : Push-Push SMD PC Card Sockets RoHS

Stock : 150000

Brand Name : NOS21-S1F1-2000-A

Packaging Details : SMD

MOQ : 1500

Delivery Time : 3-5工作日

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Product Overview

This specification covers the NANO SIM card socket connector. It is designed for reliable performance in various applications requiring SIM card connectivity.

Usage and Application:

Used for inserting and connecting NANO SIM cards in electronic devices. Suitable for mobile phones, tablets, IoT devices, and other communication modules.

Key Features:

Compact design for space-constrained applications.
Durable construction for long-term reliability.
High-quality materials for stable electrical performance.
Available in variations with or without a detection switch.

Brand GAOYUEDA ELECTRONICS CO.,LTD

Origin TAIWAN / CHINA

Part Number(s) NOS11-S1F1-2000-A, NOS21-S1F1-2000-A

Description NANO SIM Card Socket (with/without pillar)

Color Black (Housing)

Part Number	Description	Housing Material	Contact Material	Shell Material	Contact Finish	Rating Current (Max)	Contact Resistance (Max)	Dielectric Withstanding Voltage (Min)	Insulation Resistance (Min)	Mating Cycles (Min)	Operating Temperature
NOS11-S1F1-2000-A / NOS21-S1F1-2000-A	NANO SIM Card Socket	LCP S475 UL 94V-0	C5191	SUS304-H	Gold Flash Plated on Contact Area & Solder Tails	0.5 A	50 m	500 V AC	1000 M	3000 Cycles	-20C to +65C

Test Item	Requirement	Procedure
Contact Resistance	50 m Max (Initial) / 100 m Max (Final)	EIA-364-23A
Dielectric Withstanding Voltage	500 VAC for 1 minute (0.5 mA MAX current leakage)	EIA-364-20A
Insulation Resistance	100 M Min. (at 250 VDC)	EIA-364-21A
Vibration	No damage, Current discontinuity 10 s, Contact Resistance 100m	EIA-364-28A
Mechanical Shock	No damage, Discontinuity: 10s MAX, Contact Resistance100m	EIA-364-28A
Durability	No damage, Contact Resistance 100m	EIA-RS-364-09A (3000 Cycles)
Contact Normal Force	40gf /pin Min. (Initial), 25~35gf /pin Min. (After durability)	Tensile force test
Contact Retention Force	50gf /pin Min.	Tensile strength tester
Humidity Test (Steady state)	No damage, Contact resistance 100 m, Insulation Resistance 1000 M	EIA-RS-364-31A (402, 90~95% RH for 96 hours)
Thermal Shock	No damage, Contact resistance 100 m, Insulation Resistance 1000 M	EIA-364-32C (5 cycles: -55C to +85C)
Temperature Life	No damage, Contact resistance 100 m, Insulation Resistance 1000 M	85C for 96 hours
Solderability	No damage, 95% Min. coverage	EIA-RS-364-52 (245 5 for 10 0.5 seconds)
Salt Spray	No detrimental corrosion, Contact resistance 100 m	EIA-RS-364-26A (5% salt water, 352 for 16 hours)
Resistance to soldering heat	No evidence of physical damage	Reflow soldering conditions

Test Group	Test Items	Sample Quantity (pcs)
A	1, 5	5
B	1, 5	5
C	1, 5	5
D	1, 8	5
E	1, 7	5
F	1, 6	5
G	1, 4	5
H	1, 3	5
I	2, 4	5
J	2, 6	5
K	2, 5	5

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